ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,534, issued on June 30, was assigned to YAZAKI Corp. (Tokyo). "Failure detection device" was invented by Atsushi Takahashi (Susono, Japan).... और पढ़ें
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,535, issued on June 30, was assigned to Snap-on Inc. (Kenosha, Wis.). "Method and system for dynamically changing power supply rail setting... और पढ़ें
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,536, issued on June 30, was assigned to QUALCOMM Inc. (San Diego). "Low power architecture for chiplets" was invented by Praveen Raghuraman... और पढ़ें
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,537, issued on June 30, was assigned to CHROMA ATE INC. (Taoyuan City, Taiwan). "Inspection system with thermal interface, and electronic c... और पढ़ें
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,538, issued on June 30, was assigned to CITY UNIVERSITY OF HONG KONG (Kowloon, Hong Kong). "Apparatus for measuring a gate leakage current ... और पढ़ें
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,539, issued on June 30, was assigned to Feng Chia University (Taichung City, Taiwan). "Defect detection module" was invented by Yue-Der Lin... और पढ़ें
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,540, issued on June 30, was assigned to AyDeeKay LLC (Aliso Viejo, Calif.). "Phase-shifter functional safety testing" was invented by Tom H... और पढ़ें
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,541, issued on June 30, was assigned to STMicroelectronics International N.V. (Geneva). "Architecture for testing multiple scan chains" was... और पढ़ें
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,542, issued on June 30, was assigned to Siemens Healthineers AG (Forchheim, Germany). "Electrical energy generator and automatic measuremen... और पढ़ें
ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,543, issued on June 30, was assigned to Robert Bosch GmbH (Stuttgart, Germany). "Method and device for adjusting model parameters of an ele... और पढ़ें